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1

XPS, EPMA and microstructural analysis of a defective industrial plasma-nitrided steel

M. Flori, B. Gruzza, L. Bideux, G. Monier, C. Robert-Goumet, J.P. Cherré, H. de Baynast

Journal:

Surface and Coatings Technology

Year:

2008

Language:

english

File:

PDF, 2.06 MB

english, 2008

2

On the use of a O2:SF6 plasma treatment on GaAs processed surfaces for molecular beam epitaxial regrowth

O. Desplats, P. Gallo, J.B. Doucet, G. Monier, L. Bideux, L. Jalabert, A. Arnoult, G. Lacoste, C. Armand, F. Voillot, C. Fontaine

Journal:

Applied Surface Science

Year:

2009

Language:

english

File:

PDF, 608 KB

english, 2009

3

XPS study of the O2/SF6 microwave plasma oxidation of (0 0 1) GaAs surfaces

G. Monier, L. Bideux, O. Desplats, C. Fontaine, C. Robert-Goumet, B. Gruzza

Journal:

Applied Surface Science

Year:

2009

Language:

english

File:

PDF, 469 KB

english, 2009

4

A novel III–V semiconductor material for NO2 detection and monitoring

Katarzyna Wierzbowska, Luc Bideux, Boguslawa Adamowicz, Alain Pauly

Journal:

Sensors and Actuators A: Physical

Year:

2008

Language:

english

File:

PDF, 247 KB

english, 2008

5

Further insights into the photodegradation of poly(3-hexylthiophene) by means of X-ray photoelectron spectroscopy

Matthieu Manceau, Julien Gaume, Agnès Rivaton, Jean-Luc Gardette, Guillaume Monier, Luc Bideux

Journal:

Thin Solid Films

Year:

2010

Language:

english

File:

PDF, 607 KB

english, 2010

6

Role of interface states and depletion layer in NO2 sensing mechanism of n-InP epitaxial layers

K. Wierzbowska, B. Adamowicz, B. Lauron, L. Bideux

Journal:

Sensors and Actuators A: Physical

Year:

2012

Language:

english

File:

PDF, 869 KB

english, 2012

7

Passivation of III-V compounds used for metal-insulator-InP(100) structures

Bideux, L., Merle, S., Robert, C., Gruzza, B., Benamarra, Z., Tizi, S., Chellali, M.

Journal:

Surface and Interface Analysis

Year:

1998

Language:

english

File:

PDF, 261 KB

english, 1998

8

Some applications of elastic peak electron spectroscopy for semiconductor surface studies

Bideux, L., Robert, C., Merle, S., Gruzza, B., Goumet, E., Gil-Lafon, E.

Journal:

Surface and Interface Analysis

Year:

1998

Language:

english

File:

PDF, 101 KB

english, 1998

9

Determination of yield ratios of elastically backscattered electrons for deriving inelastic mean free paths in solids

D. Varga, L. Kövér, J. Tóth, K. Tökési, B. Lesiak, Jablonski, C. Robert, B. Gruzza, L. Bideux

Journal:

Surface and Interface Analysis

Year:

2000

Language:

english

File:

PDF, 83 KB

english, 2000

10

Angular distribution of electrons elastically reflected from polycrystalline metals (Pd, In)

C. Robert, S. Zuber, L. Bideux, S. Merle, B. Gruzza, V. Nehasil, V. Matolin

Journal:

Surface and Interface Analysis

Year:

2000

Language:

english

File:

PDF, 94 KB

english, 2000

11

Interdisciplinary surface studies on porous Si(PSi)—I. Elastic peak electron spectroscopy (EPES), valence band XPS and atomic force microscopy (AFM)

B Gruzza, L Bideux, C Robert, G Salace, E Vázsonyi, G Petô, L Guczi, G Gergely

Journal:

Year:

1995

Language:

english

File:

PDF, 358 KB

english, 1995

12

Some problems of electron spectroscopy (AES, EPES) using a retarding field analyser

A. Sulyok, G. Gergely, B. Gruzza, L. Bideux

Journal:

Year:

1994

Language:

english

File:

PDF, 239 KB

english, 1994

13

The Monte Carlo method applied to the electrons elastically reflected by a copper sample

P. Bondot, A. Porte, B. Gruzza, L. Bideux, S. Mróz

Journal:

Year:

1994

Language:

english

File:

PDF, 218 KB

english, 1994

14

The interaction of hydrogen with the InP(100) substrates studied by AES, elastic peak electron spectroscopy (EPES) and EELS

A. Porte, B. Gruzza, C.A. Bondot, L. Bideux, C. Jardin, G. Gergely

Journal:

Journal of Electron Spectroscopy and Related Phenomena

Year:

1994

Language:

english

File:

PDF, 579 KB

english, 1994

15

Auger electronic spectroscopy and electrical characterisation of InP(100) surfaces passivated by N2 plasma

M Petit, Ch Robert-Goumet, L Bideux, B Gruzza, Z Benamara, N.Bachir Bouiadjra, V Matolin

Journal:

Applied Surface Science

Year:

2004

Language:

english

File:

PDF, 132 KB

english, 2004

16

Combined EELS, LEED and SR-XPS study of ultra-thin crystalline layers of indium nitride on InP(1 0 0)—Effect of annealing at 450 °C

C. Robert-Goumet, M. Petit, L. Bideux, B. Gruzza, G. Monier, V. Matolín, T. Skála, N. Tsud, K.C. Prince

Journal:

Applied Surface Science

Year:

2007

Language:

english

File:

PDF, 606 KB

english, 2007

17

XPS study of the formation of ultrathin GaN film on GaAs(1 0 0)

L. Bideux, G. Monier, V. Matolin, C. Robert-Goumet, B. Gruzza

Journal:

Applied Surface Science

Year:

2008

Language:

english

File:

PDF, 566 KB

english, 2008

18

A study of the 42CrMo4 steel surface by quantitative XPS electron spectroscopy

M. Flori, B. Gruzza, L. Bideux, G. Monier, C. Robert-Goumet

Journal:

Applied Surface Science

Year:

2008

Language:

english

File:

PDF, 717 KB

english, 2008

19

XPS, electric and photoluminescence-based analysis of the GaAs (1 0 0) nitridation

Z. Benamara, N. Mecirdi, B. Bachir Bouiadjra, L. Bideux, B. Gruzza, C. Robert, M. Miczek, B. Adamowicz

Journal:

Applied Surface Science

Year:

2006

Language:

english

File:

PDF, 309 KB

english, 2006

20

First stages of surface steel nitriding: X-ray photoelectron spectroscopy and electrical measurements

M. Flori, B. Gruzza, L. Bideux, G. Monier, C. Robert-Goumet, Z. Benamara

Journal:

Applied Surface Science

Year:

2009

Language:

english

File:

PDF, 345 KB

english, 2009

21

Growth study of thin indium nitride layers on InP (1 0 0) by Auger electron spectroscopy and photoluminescence

S. Ben Khalifa, F. Saidi, B. Gruzza, C. Robert-Goumet, L. Bideux, F. Hassen, H. Maaref

Journal:

Journal of Crystal Growth

Year:

2009

Language:

english

File:

PDF, 671 KB

english, 2009

22

Morphology and optical properties of p-type porous GaAs(1 0 0) layers made by electrochemical etching

S. Ben Khalifa, B. Gruzza, C. Robert-Goumet, G. Bremond, M. Hjiri, F. Saidi, L. Bideux, L. Bèji, H. Maaref

Journal:

Journal of Luminescence

Year:

2008

Language:

english

File:

PDF, 930 KB

english, 2008

23

Nitridation of InP(1 0 0) substrates studied by XPS spectroscopy and electrical analysis

A. Talbi, Z. Benamara, B. Akkal, B. Gruzza, L. Bideux, C. Robert, C. Varenne, N. Chami

Journal:

Materials Science and Engineering: A

Year:

2006

Language:

english

File:

PDF, 646 KB

english, 2006

24

Surface modification of GaAs during argon ionic cleaning and nitridation: EELS, EPES and XPS studies

L. Bideux, D. Baca, B. Gruzza, V. Matolin, C. Robert-Goumet

Journal:

Surface Science

Year:

2004

Language:

english

File:

PDF, 332 KB

english, 2004

25

Nitridation of InP(1 0 0) surface studied by synchrotron radiation

M. Petit, D. Baca, S. Arabasz, L. Bideux, N. Tsud, S. Fabik, B. Gruzza, V. Chab, V. Matolin, K.C. Prince

Journal:

Surface Science

Year:

2005

Language:

english

File:

PDF, 236 KB

english, 2005

26

Study of porous III–V semiconductors by electron spectroscopies (AES and XPS) and optical spectroscopy (PL): Effect of ionic bombardment and nitridation process

S. Ben Khalifa, B. Gruzza, C. Robert-Goumet, L. Bideux, G. Monier, F. Saidi, R. M’Ghaieth, M. Hjiri, R. Hamila, F. Hassen, H. Maaref, G. Bremond, L. Bèji

Journal:

Surface Science

Year:

2007

Language:

english

File:

PDF, 487 KB

english, 2007

27

Effect of surface roughness on EPES and AREPES measurements: Flat and crenels silicon surfaces

S. Chelda, C. Robert-Goumet, B. Gruzza, L. Bideux, G. Monier

Journal:

Surface Science

Year:

2008

Language:

english

File:

PDF, 607 KB

english, 2008

28

SEM and XPS studies of nanohole arrays on InP(1 0 0) surfaces created by coupling AAO templates and low energy Ar+ ion sputtering

C. Robert-Goumet, G. Monier, B. Zefack, S. Chelda, L. Bideux, B. Gruzza, O.K. Awitor

Journal:

Surface Science

Year:

2009

Language:

english

File:

PDF, 710 KB

english, 2009

29

Experimental system for GaN thin films growth and in situ characterisation by electron spectroscopic methods

V. Matolı́n, S. Fabı́k, J. Glosı́k, L. Bideux, Y. Ould-Metidji, B. Gruzza

Journal:

Year:

2004

Language:

english

File:

PDF, 219 KB

english, 2004

30

A study of the Au/Pd interface formation using the elastic peak electron spectroscopy method

B. Gruzza, C. Robert, L. Bideux, J.M. Guglielmacci

Journal:

Microelectronics Journal

Year:

1999

Language:

english

File:

PDF, 310 KB

english, 1999

31

Electrical characterization of the Au/InP(100) and Au/InSb/InP(100) structures

B. Akkal, Z. Benamara, L. Bideux, B. Gruzza

Journal:

Microelectronics Journal

Year:

1999

Language:

english

File:

PDF, 215 KB

english, 1999

32

Characterization of the M.S structure by the surface photoelectrical voltage method

Z Benamara, B Akkal, A Boudissa, L Bideux, B Gruzza

Journal:

Microelectronics Journal

Year:

1999

Language:

english

File:

PDF, 171 KB

english, 1999

33

Characterization of interface states at Au/InSb/InP(100) Schottky barrier diodes as a function of frequency

B. Akkal, Z. Benamara, B. Gruzza, L. Bideux

Journal:

Year:

2000

Language:

english

File:

PDF, 175 KB

english, 2000

34

Nitridation of InP(1 0 0) surface studied by AES and EELS spectroscopies

Y Ould-Metidji, L Bideux, V Matolin, B Gruzza, C Robert

Journal:

Year:

2001

Language:

english

File:

PDF, 143 KB

english, 2001

35

Study and characterization of the structures Au/Al2O3/Si and Au/Al0/Al2O3/Si

B. Gruzza, B. Akkal, L. Bideux, Z. Benamara, C. Robert

Journal:

Year:

2002

Language:

english

File:

PDF, 152 KB

english, 2002

36

Retarding field analyser used in elastic peak electron spectroscopy

D Zeze, L Bideux, B Gruzza, F Gołek, D Dańko, S Mróz

Journal:

Year:

1997

Language:

english

File:

PDF, 274 KB

english, 1997

37

Electrons elastically backscattered from Al, Ag and Au samples

B Gruzza, C Robert, B Peuchot, L Bideux

Journal:

Year:

1998

Language:

english

File:

PDF, 424 KB

english, 1998

38

Crystalline effects in elastic peak electron spectroscopy

G. Gergely, A. Barna, A. Sulyok, C. Jardin, B. Gruzza, L. Bideux, C. Robert, J. Toth, D. Varga

Journal:

Year:

1999

Language:

english

File:

PDF, 272 KB

english, 1999

39

UHV aluminium oxide on silicon substrates: electron spectroscopies analysis and electrical measurements

B Gruzza, S Merle, L Bideux, C Robert, L Kover, J Toth, V Matolin

Journal:

Applied Surface Science

Year:

2001

Language:

english

File:

PDF, 126 KB

english, 2001

40

Elastic reflection of electrons by porous silicon layered (PSL) surfaces: effects of porosity

C. Robert, L. Bideux, B. Gruzza, E. Vazsonyi, G. Gergely

Journal:

Applied Surface Science

Year:

1997

Language:

english

File:

PDF, 367 KB

english, 1997

41

Epitaxial growth of InAsxP1−x/InP quantum wells by HVPE

E. Goumet, E. Gil-Lafon, R. Cadoret, D. Castelluci, J. Leymarie, A.M. Vasson, A. Vasson, L. Bideux, B. Gruzza

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 240 KB

english, 1999

42

Experimental determination of the inelastic mean free path of electrons in GaSb and InSb

G Gergely, A Sulyok, M Menyhard, J Toth, D Varga, A Jablonski, M Krawczyk, B Gruzza, L Bideux, C Robert

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 125 KB

english, 1999

43

A Monte Carlo study for electron elastic backscattering based on layered models for substrates

C. Robert, B. Gruzza, L. Bideux, P. Bondot

Journal:

Mathematics and Computers in Simulation

Year:

1998

Language:

english

File:

PDF, 345 KB

english, 1998

44

Effect of InSb layer on the interfacial and electrical properties in the structures based on InP

M. Chellali, B. Akkal, S. Tizi, Z. Benamara, B. Gruzza, C. Robert, L. Bideux

Journal:

Materials Science and Engineering: B

Year:

2000

Language:

english

File:

PDF, 105 KB

english, 2000

45

Modelization and characterization of Au/InSb/InP Schottky systems as a function of temperature

B. Akkal, Z. Benamara, A. Boudissa, N. Bachir Bouiadjra, M. Amrani, L. Bideux, B. Gruzza

Journal:

Materials Science and Engineering: B

Year:

1998

Language:

english

File:

PDF, 167 KB

english, 1998

46

Electrical parameters evolution of Au/InP(100) and Au/InSb/InP(100) systems with restructuring conditions

Z Benamara, B Akkal, A Talbi, B Gruzza, L Bideux

Journal:

Materials Science and Engineering: C

Year:

2002

Language:

english

File:

PDF, 117 KB

english, 2002

47

Analysis and simulation of Au/InSb/InP diode C–V characteristic: modeling and experiments

B Akkal, Z Benamara, B Gruzza, L Bideux, N Bachir Bouiadjra

Journal:

Materials Science and Engineering: C

Year:

2002

Language:

english

File:

PDF, 152 KB

english, 2002

48

Studies of gas sensing, electrical and chemical properties of n-InP epitaxial surfaces

K. Wierzbowska, A. Pauly, B. Adamowicz, L. Bideux

Journal:

physica status solidi (a)

Year:

2006

Language:

english

File:

PDF, 250 KB

english, 2006

49

Electron inelastic mean free paths (IMFPs) in binary Au–Cu alloys determined by elastic peak electron spectroscopy

M. Krawczyk, L. Zommer, A. Jablonski, C. Robert, J. Pavluch, L. Bideux, B. Gruzza

Journal:

Surface and Interface Analysis

Year:

2001

Language:

english

File:

PDF, 134 KB

english, 2001

50

Study of InP(100) surface nitridation by x-ray photoelectron spectroscopy

L. Bideux, Y. Ould-Metidji, B. Gruzza, V. Matolin

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 137 KB

english, 2002

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